SPICE Model
PDK
Standard Cell
Low Frequency Noise Measurement System
Sets new records in measurement speed, system resolution and coverage of different types of measurement requirements
Supports all device types with wide operating conditions, including high voltage up to 200V and extreme low current down to 10pA
Accommodates a complete range of measurement conditions for both high and low impedance devices, ranging from 10Ω to 10MΩ
Delivers significant and innovative improvement in hardware & software design
Used in conjunction with semiconductor parameter testing system FS-Pro
Widely used for development of the most advanced semiconductor process technology nodes from 28nm to 3nm
Industry's golden tool
for low-frequency noise measurement
Wafer-level accuracy
wide voltage/current/impedance range
Validated high precision & high testing throughput parallel test capability
Recognized system architecture
high-precision & reliable
Indispensable tool
for leading Foundries & Fabless
For both high and low impedance devices
ranging from 10Ω to 10MΩ
Process development
quality assessment
& quality control
Noise characterization for SPICE model extraction
Process/device evalsuation for advanced IC design
Cutting-edge
IC design
& verification
